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Characterization of laser-transferred bismuth ferrite lead titanate ferroelectric thick films

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4 Author(s)
Comyn, Tim P. ; Institute for Materials Research, University of Leeds, Leeds LS2 9JT, United Kingdom ; Chakraborty, T. ; Miles, Robert E. ; Milne, Steven J.

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Thick films of 0.7BiFeO3–0.3PbTiO3 have been deposited on sapphire substrates by tape casting and sintering at 1000 °C. Films 20 μm in thickness were released from the fabrication substrate using KrF pulsed laser radiation, and epoxy bonded to platinized silicon substrates in order to demonstrate the low-temperature integration possibilities of xBiFeO3–(1-x)PbTiO3 films. Despite structural changes at the laser-released film interface, strain-electric field loops are typical of a ferroelectric, showing an ultimate strain of 0.09%. X-ray diffraction and scanning electron microscopy observations suggest that interfacial melting and migration of Bi2O3 is involved in the lift-off process.

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Applied Physics Letters  (Volume:93 ,  Issue: 5 )