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Scanning optical probe microscopy with submicrometer resolution using an organic photodetector

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5 Author(s)
An, Kwang H. ; Department of Mechanical Engineering, The University of Michigan, Ann Arbor, Michigan 48109-2125, USA ; OConnor, Brendan ; Pipe, Kevin P. ; Zhao, Yiying
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A high-resolution scanning optical microscopy technique is demonstrated, in which an organic photodetector on a silicon-based scanning probe cantilever scans a sample, simultaneously recording optical and topographic data with submicrometer resolution, while showing no measurable degradation during the scan. Potential applications of the probe include characterization of optoelectronic materials and devices, as well as simultaneous topographic and fluorescence microscopy of biological samples. Extension to these applications is aided by the fact that the probe is compatible with conventional atomic force microscopy systems and does not suffer some of the practical difficulties of existing near-field scanning optical microscopy systems.

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Applied Physics Letters  (Volume:93 ,  Issue: 3 )