Skip to Main Content
Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.2963033
A high-resolution scanning optical microscopy technique is demonstrated, in which an organic photodetector on a silicon-based scanning probe cantilever scans a sample, simultaneously recording optical and topographic data with submicrometer resolution, while showing no measurable degradation during the scan. Potential applications of the probe include characterization of optoelectronic materials and devices, as well as simultaneous topographic and fluorescence microscopy of biological samples. Extension to these applications is aided by the fact that the probe is compatible with conventional atomic force microscopy systems and does not suffer some of the practical difficulties of existing near-field scanning optical microscopy systems.