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Interfacial structure and chemistry of epitaxial CoFe2O4 thin films on SrTiO3 and MgO substrates

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4 Author(s)
Xie, S. ; Department of Materials Science and Engineering, Northwestern University, 2220 Campus Drive, Evanston, Illinois 60208-3108, USA ; Cheng, J. ; Wessels, B.W. ; Dravid, V.P.

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Interfacial structure and chemistry of epitaxial CoFe2O4 thin films on (001)_SrTiO3 and (001)_MgO substrates were investigated using high-angle-annular-dark-field imaging combined with electron-energy-loss-spectra (EELSs) analyses at a subnanometer scale. The results show that CoFe2O4/SrTiO3 interface is semicoherent with requisite dislocation density to accommodate ∼7% lattice mismatch, while the small (∼0.3%) lattice mismatch renders CoFe2O4/MgO interface coherent. EELS indicates that Fe valence is nominally +3, with no measurable change across the interfaces. Structural characterization corroborates with observed lower saturation magnetization of CoFe2O4 on MgO, which is a consequence of tensile stress built up in the <100>-direction negative magnetostrictive CoFe2O4.

Published in:

Applied Physics Letters  (Volume:93 ,  Issue: 18 )

Date of Publication:

Nov 2008

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