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Substrate-induced strain effect in La0.875Ba0.125MnO3 thin films grown on ferroelectric single-crystal substrates

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5 Author(s)
Zheng, R.K. ; Department of Applied Physics and Materials Research Center, The Hong Kong Polytechnic University, Hong Kong, People’s Republic of China ; Wang, Y. ; Chan, H.L.W. ; Choy, C.L.
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The authors have studied the substrate-induced strain effect in La0.875Ba0.125MnO3 (LBMO) thin films grown on ferroelectric 0.67Pb(Mg1/3Nb2/3)O3–0.33PbTiO3 (PMN-PT) single-crystal substrates. Both the strain and resistance of the films can be in situ varied by applying an electric field across the PMN-PT substrates. X-ray diffraction analysis indicates that the variations of strain and resistance result from the induced strain in the PMN-PT substrate due to the ferroelectric polarization or the converse piezoelectric effect. The relationships between the resistance and the induced strain in the LBMO film and PMN-PT substrate have been quantitatively analyzed.

Published in:
Applied Physics Letters  (Volume:92 ,  Issue: 8 )

Date of Publication: Feb 2008

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