The authors have studied the substrate-induced strain effect in La0.875Ba0.125MnO3 (LBMO) thin films grown on ferroelectric 0.67Pb(Mg1/3Nb2/3)O3–0.33PbTiO3 (PMN-PT) single-crystal substrates. Both the strain and resistance of the films can be in situ varied by applying an electric field across the PMN-PT substrates. X-ray diffraction analysis indicates that the variations of strain and resistance result from the induced strain in the PMN-PT substrate due to the ferroelectric polarization or the converse piezoelectric effect. The relationships between the resistance and the induced strain in the LBMO film and PMN-PT substrate have been quantitatively analyzed.
Published in:
Applied Physics Letters
(Volume:92
,
Issue:
8
)
Date of Publication:
Feb 2008
- Page(s):
-
082908
-
082908-3
- ISSN :
-
0003-6951
- Digital Object Identifier :
-
10.1063/1.2870100
- Product Type:
-
Journals & Magazines
- Date of Current Version :
-
18 June 2009
- Issue Date :
-
Feb 2008