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Electrode structures in diode-type cadmium telluride detectors: Field emission scanning electron microscopy and energy-dispersive x-ray microanalysis

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4 Author(s)
Okada, Kyoko ; Japan Synchrotron Radiation Research Institute (JASRI), 1-1-1 Kouto, Sayo, Hyogo 679-5198, Japan ; Yasufuku, Hideyuki ; Yoshikawa, Hideki ; Sakurai, Yoshiharu

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The structures of the interface regions between CdTe crystal and electrodes in diode-type CdTe x-ray detectors with a layout of In(anode)/CdTe/Pt(cathode) are reported. The structures have been investigated by field emission scanning electron microscopy and energy-dispersive x-ray microanalysis. The investigation has revealed that the structures are complicated. The anode-side interface is a contact between In1-xTex alloys and CdTe crystal. The cathode side is a structure of Pt/(Te-rich phase)/CdTe. These findings suggest that the complicated structures in the interface regions are a possible cause for the polarization phenomenon observed in the diode-type CdTe detectors.

Published in:

Applied Physics Letters  (Volume:92 ,  Issue: 7 )

Date of Publication:

Feb 2008

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