Cart (Loading....) | Create Account
Close category search window

Effect of surface charge trapping on dielectric barrier discharge

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Li, Ming ; Beijing Key Laboratory of High Voltage and EMC, School of Electric and Electronic Engineering, North China Electric Power University, Beijing 102206, China ; Chengrong Li ; Zhan, Huamao ; Xu, Jinbao
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link: 

The experiment of dielectric barrier discharge in a 2 mm air gap shows that the pressure range of a uniform discharge using polytetrafluoroethylene as barrier is much wider than that using quartz or alumina. The parameters of the charge trapped on the surface of these three dielectric barriers were obtained by surface charge measurement and thermally stimulated current measurement. It was found that surface charge trapping has much influence on the uniform discharge, i.e., the seed electrons necessary for uniform discharge may be produced by the desorption of the absorbed electrons in the shallow trap with energy level lower than 1 eV.

Published in:

Applied Physics Letters  (Volume:92 ,  Issue: 3 )

Date of Publication:

Jan 2008

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.