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Influence of tip-sample interaction in a time-domain terahertz scattering near field scanning microscope

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2 Author(s)
Thoma, A. ; Department of Physics and Center for Applied Photonics, University of Konstanz, D-78457 Konstanz, Germany ; Dekorsy, T.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.2949858 

Apertureless near field measurements with a metallic tip are performed in the terahertz frequency range. Lateral scans are recorded for different time delays within a terahertz pulse. The forward scattered terahertz signal strongly depends on the time delay. At larger time delays, the tip-sample interaction leads to additional structures in the scan that do not correspond to a change in topography or dielectric function.

Published in:

Applied Physics Letters  (Volume:92 ,  Issue: 25 )

Date of Publication:

Jun 2008

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