Cart (Loading....) | Create Account
Close category search window

Structural degradation and optical property of nanocrystalline ZnO films grown on Si (100)

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Yang, Boqian ; Department of Physics, University of Puerto Rico, San Juan 00931-23343, Puerto Rico ; Kumar, A. ; Feng, Peter ; Katiyar, R.S.

Your organization might have access to this article on the publisher's site. To check, click on this link: 

Structural degradation of nanocrystalline ZnO films was observed with an increase in films thickness. Nanocrystalline epitaxial thin film with thickness of ∼170 nm changed to polycrystalline ∼900 nm with an increase in deposition time. Surface morphology revealed an average grain size of 30–50 nm. Spatial correlation model indicated structural disorder due to relative disorientation of crystalline phases at nanoscale. The photoluminescence spectra showed free exciton (FX) ∼3.31 eV, donor bound-exciton (DoX) ∼3.26 and donor-acceptor-pair (DAP) ∼3.22 eV for thin films, which redshift, i.e., FX ∼3.30, DoX ∼3.24 eV, and DAP ∼3.19–3.17 eV for thicker films (400–900 nm).

Published in:

Applied Physics Letters  (Volume:92 ,  Issue: 23 )

Date of Publication:

Jun 2008

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.