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Browse Journals & Magazines > Applied Physics Letters ...> Volume:92 Issue:14 Help

Pattern evolution due to energetic solid-state diffusion front in nanoscale thin film

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1 Author(s)
Aurongzeb, Deeder ; Department of Physics and NanoTech Center, Lubbock, Texas 79401, USA

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.2907848 

We report the study on oscillatory pattern/domain formation due to energetic solid-state reaction in a metallic multilayer thin film using a scanning probe microscope. The observed oscillatory patterns become more ordered as the total thickness changed from 50 nm to 1.2 μm. At higher thickness, a nonlinear cross oscillation pattern is also observed, which we attribute to spinning wave. The observed oscillation is modeled in terms of perturbation in the thermal wave. Magnetization measurement shows increased coercivity for the reacted film.

Published in:
Applied Physics Letters  (Volume:92 ,  Issue: 14 )

Date of Publication: Apr 2008

Page(s):
141914 - 141914-3
ISSN :
0003-6951
Digital Object Identifier :
10.1063/1.2907848
Product Type:
Journals & Magazines
Date of Current Version :
18 June 2009
Issue Date :
Apr 2008

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