Cart (Loading....) | Create Account
Close category search window

Resonance magnetoelectric interactions due to bending modes in a nickel-lead zirconate titanate bilayer

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Chashin, D.V. ; Moscow State Institute of Radio Engineering, Electronics and Automation 119454 Moscow, Russia ; Fetisov, Y.K. ; Kamentsev, K.E. ; Srinivasan, G.

Your organization might have access to this article on the publisher's site. To check, click on this link: 

Resonance magnetoelectric (ME) effects due to bending oscillations have been investigated in bilayers of Ni and lead zirconate titanate (PZT). For nominal sample dimensions, such oscillations occur at a few kilohertz that are much smaller than radial or thickness acoustic modes and result in ME voltage coefficients of 1 V/cm Oe for tangential magnetization. The mode frequencies can be controlled with proper choice for thicknesses of Ni and PZT. Theoretical estimates of mode frequencies are in very good agreement with the data. The resonator is potentially useful for realizing low-loss ME sensor networks for ac fields as low as 10 μOe.

Published in:

Applied Physics Letters  (Volume:92 ,  Issue: 10 )

Date of Publication:

Mar 2008

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.