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Two-dimensional refractive index profiling by using differential near-field scanning optical microscopy

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3 Author(s)
Wan-Shao Tsai ; Graduate Institute of Electronics Engineering, National Taiwan University, No. 1, Section 4, Roosevelt Road, Taipei, Taiwan 10617, Republic of China ; Wang, Way‐Seen ; Wei, Pei-Kuen

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The authors present two-dimensional reconstruction of the refractive index profile of an optical waveguide by using differential near-field optical microscopy. Using an inverse algorithm, the refractive index distribution is obtained directly from the measured optical near-field and its derivatives without any assumption of the index profile. The proposed method also takes advantage of subwavelength resolution and low noises in the waveguide region. Two-dimensional index profile reconstruction of a single mode fiber is measured for the demonstration. The measured optical field distribution and refractive index profile agree quite well with the calculated mode and the known index profile.

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Applied Physics Letters  (Volume:91 ,  Issue: 6 )