Highly (100) oriented Ba1-xSrxTiO3 (BST) thin films were grown on LaNiO3 coated silicon substrate by modified sol-gel process. X-ray diffraction analysis shows that the out-of-plane lattice constant decreases linearly with increase of Sr concentration. The energy band gaps (Eg) of BST thin films exhibit strong dependence on Sr content by analyzing the results of the spectroscopic ellipsometer (SE) measurement. The smallest Eg has been obtained at x=0.3, which is at the phase boundary of cube phase and tetragonal phase. The refractive index and thickness of BST thin films were obtained by fitting SE data with a multiphase model.
Published in:
Applied Physics Letters
(Volume:91
,
Issue:
6
)
Date of Publication:
Aug 2007
- Page(s):
-
061104
-
061104-3
- ISSN :
-
0003-6951
- Digital Object Identifier :
-
10.1063/1.2767986
- Product Type:
-
Journals & Magazines
- Date of Current Version :
-
18 June 2009
- Issue Date :
-
Aug 2007