Cart (Loading....) | Create Account
Close category search window

Room-temperature atmospheric argon plasma jet sustained with submicrosecond high-voltage pulses

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Walsh, J.L. ; Department of Electronic and Electrical Engineering, Loughborough University, Loughborough, Leicestershire LE11 3TU, United Kingdom ; Kong, M.G.

Your organization might have access to this article on the publisher's site. To check, click on this link: 

In this letter, an experimental study is presented to characterize a room-temperature plasma jet in atmospheric argon generated with submicrosecond voltage pulses at 4 kHz. Distinct from sinusoidally produced argon discharges that are prone to thermal runaway instabilities, the pulsed atmospheric argon plasma jet is stable and cold with an electron density 3.9 times greater than that in a comparable sinusoidal jet. Its optical emission is also much stronger. Electrical measurement suggests that the discharge event is preceded with a prebreakdown phase and its plasma stability is facilitated by the short voltage pulses.

Published in:

Applied Physics Letters  (Volume:91 ,  Issue: 22 )

Date of Publication:

Nov 2007

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.