Close category search window
 

Ductility at the nanoscale: Deformation and fracture of adhesive contacts using atomic force microscopy

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Pradeep, N. ; National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA ; Kim, D.-I. ; Grobelny, J. ; Hawa, T.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.2815648 

Fracture of nanosize contacts formed between spherical probes and flat surfaces is studied using an atomic force microscope in an ultrahigh vacuum environment. Analysis of the observed deformation during the fracture process indicates significant material extensions for both gold and silica contacts. The separation process begins with an elastic deformation followed by plastic flow of material with atomic rearrangements close to the separation. Classical molecular dynamics studies show similarity between gold and silicon, materials that exhibit entirely different fracture behavior at macroscopic scale. This direct experimental evidence suggests that fracture at nanoscale occurs through a ductile process.

Published in:
Applied Physics Letters  (Volume:91 ,  Issue: 20 )

Date of Publication: Nov 2007

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.