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Focused ion beam milling as a universal template technique for patterned growth of carbon nanotubes

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5 Author(s)
Chen, Ying ; Department of Electronic Materials Engineering, Research School of Physical Sciences and Engineering, The Australian National University, Canberra, Australian Capital Territory, 0200, Australia ; Chen, Hua ; Yu, Jun ; Williams, James S.
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Focused ion beam (FIB) milling system has been used to create nanosized patterns as the template for patterned growth of carbon nanotubes on Si substrate surface without predeposition of metal catalysts. Carbon nanotubes only nucleate and grow on the template under controlled pyrolysis of iron phthalocyanine at 1000 °C. The size, growth direction, and density of the patterned nanotubes can be controlled under different growth conditions and template sizes. Atomic force microscopy and electron microscopy analyses reveal that the selective growth on the FIB template is due to its special surface morphology and crystalline structure.

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Applied Physics Letters  (Volume:90 ,  Issue: 9 )