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Browse Journals & Magazines > Applied Physics Letters ...> Volume:90 Issue:9 Help

Focused ion beam milling as a universal template technique for patterned growth of carbon nanotubes

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5 Author(s)
Chen, Ying ; Department of Electronic Materials Engineering, Research School of Physical Sciences and Engineering, The Australian National University, Canberra, Australian Capital Territory, 0200, Australia ; Chen, Hua ; Yu, Jun ; Williams, James S.
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Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.2710785 

Focused ion beam (FIB) milling system has been used to create nanosized patterns as the template for patterned growth of carbon nanotubes on Si substrate surface without predeposition of metal catalysts. Carbon nanotubes only nucleate and grow on the template under controlled pyrolysis of iron phthalocyanine at 1000 °C. The size, growth direction, and density of the patterned nanotubes can be controlled under different growth conditions and template sizes. Atomic force microscopy and electron microscopy analyses reveal that the selective growth on the FIB template is due to its special surface morphology and crystalline structure.

Published in:
Applied Physics Letters  (Volume:90 ,  Issue: 9 )

Date of Publication: Feb 2007

Page(s):
093126 - 093126-3
ISSN :
0003-6951
Digital Object Identifier :
10.1063/1.2710785
Product Type:
Journals & Magazines
Date of Current Version :
18 June 2009
Issue Date :
Feb 2007

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