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Charge retention behavior of preferentially oriented and textured Bi3.25La0.75Ti3O12 thin films by electrostatic force microscopy

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5 Author(s)
Kim, T.Y. ; Department of Physics, Ewha Womans University, Seoul 120-750, Korea and Division of Nanosciences, Ewha Womans University, Seoul 120-750, Korea ; Lee, J.H. ; Oh, Y.J. ; Choi, M.R.
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The authors report charge retention in preferentially (117) oriented and textured c-axis oriented ferroelectric Bi3.25La0.75Ti3O12 thin films by electrostatic force microscopy. Surface charges of the films were observed as a function of time in a selected area which consists of a single-poled region and a reverse-poled region. The highly (117) oriented film shows the extended exponential decay with characteristic scaling exponents, n=1.5–1.6. The preferentially c-axis oriented film shows a remarkable retained behavior regardless of the poling. Decay and retention mechanisms of the regions are explained by space-charge redistribution and trapping of defects in the films.

Published in:

Applied Physics Letters  (Volume:90 ,  Issue: 8 )

Date of Publication:

Feb 2007

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