Cart (Loading....) | Create Account
Close category search window

On the through-thickness critical current density of an YBa2Cu3O7-x film containing a high density of insulating, vortex-pinning nanoprecipitates

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

7 Author(s)
Kim, S.I. ; Applied Superconductivity Center, National High Magnetic Field Laboratory, Florida State University, Tallahassee, Florida 32310 ; Kametani, F. ; Chen, Z. ; Gurevich, A.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link: 

Using sequential ion milling the authors have studied the thickness dependence of the critical current density Jc(H) of a single crystal 1 μm thick YBa2Cu3O7-x thin film containing ∼5 vol % of insulating Y2BaCuO5 (Y211) nanoparticles in order to better understand how to obtain high critical currents in thick films. Except very near the interface where the defect density was enhanced, Jc(H) in the body of the film was uniform and independent of thickness with a high maximum pinning force of 8.8 GN/m3 at 77 K. The authors conclude that the nanoscale Y211 precipitates result in strong, three-dimensional pinning characterized by a pin spacing of ∼30 nm, much smaller than the film thickness.

Published in:

Applied Physics Letters  (Volume:90 ,  Issue: 25 )

Date of Publication:

Jun 2007

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.