By Topic

Field emission observed from metal-diamond junctions revealed by atomic force microscopy

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

The purchase and pricing options are temporarily unavailable. Please try again later.
7 Author(s)
Furkert, S.A. ; H.H. Wills Physics Laboratory, University of Bristol, Avon BS8 1TL, United Kingdom ; Wotherspoon, A. ; Cherns, D. ; Fox, N.A.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.2746079 

A noncontact atomic force microscopy technique has been developed that enables sources of field emission to be detected and mapped in an air ambient. Areas as large as 900 μm2 have been mapped. This new technique enables determination of the location and extent of the emission area on an individual emitting particle. Emission from nanodiamond particles is shown to occur not at the tip of the diamond, but from near the base where it forms a triple junction with the metal substrate. The reported observations should assist exploration of novel methods of controlling electron emission from devices constructed using diamond particles.

Published in:

Applied Physics Letters  (Volume:90 ,  Issue: 24 )