Cart (Loading....) | Create Account
Close category search window

Cutoff wavelength of Hg1-xCdxTe epilayers by infrared photoreflectance spectroscopy

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

9 Author(s)
Shao, Jun ; National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 200083 Shanghai, China ; Lu, Xiang ; Lu, Wei ; Yue, Fangyu
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link: 

A comparative study of cutoff wavelength is performed by photocurrent (PC), transmission, and infrared photoreflectance (PR) spectroscopies on arsenic-doped Hg1-xCdxTe molecular beam epitaxial layers in the midinfrared spectral region. It is illustrated that (i) a shorter cutoff wavelength of PC response may be predicted by either the band gap or the energy of the half-maximum transmission and (ii) the main PR peak is coincident energetically to that of the third-derivative maximum of the PC spectrum. The mechanism behind is discussed with the aid of photoluminescence measurements. The results indicate that the infrared PR spectroscopy may serve as a contactless alternative to the PC spectroscopy for predicting the cutoff wavelength of narrow-gap HgCdTe epilayers reliably.

Published in:

Applied Physics Letters  (Volume:90 ,  Issue: 17 )

Date of Publication:

Apr 2007

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.