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Q-controlled amplitude modulation atomic force microscopy in liquids: An analysis

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2 Author(s)
Holscher, H. ; Department of Mechanical Engineering, Yale University, P.O. Box 208284, New Haven, Connecticut 06520-8284 ; Schwarz, U.D.

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An analysis of amplitude modulation atomic force microscopy in liquids is presented with respect to the application of the Q-Control technique. The equation of motion is solved by numerical and analytic methods with and without Q-Control in the presence of a simple model interaction force adequate for many liquid environments. In addition, the authors give an explicit analytical formula for the tip-sample indentation showing that higher Q factors reduce the tip-sample force. It is found that Q-Control suppresses unwanted deformations of the sample surface, leading to the enhanced image quality reported in several experimental studies.

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Applied Physics Letters  (Volume:89 ,  Issue: 7 )