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Anisotropic ferro- and piezoelectric properties of sol-gel-grown Bi3.15Nd0.85Ti3O12 films with two different orientations on Pt/Ti/SiO2/Si

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7 Author(s)
Lu, C.J. ; Department of Materials Science and Engineering, Hubei University, Wuhan 430062, People’s Republic of China and Max Planck Institute of Microstructure Physics, Weinberg 2, D-06120 Halle, Germany ; Liu, X.L. ; Chen, X.Q. ; Nie, C.J.
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Bi3.15Nd0.85Ti3O12 thin films of two different preferred orientations were sol-gel grown on Pt/Ti/SiO2/Si. Using different heating rates during crystallization, either films containing 65% columnar grains with (104)/(014) orientation or fine-grained films with a predominant c-axis orientation were obtained. Anisotropic ferroelectric and piezoelectric properties were determined, with a remanent polarization 2Pr=46.4 μC/cm2 and a piezoelectric coefficient d33=17 pm/V in a predominantly (104)/(014)-oriented film, but only 2Pr=16.7 μC/cm2 and d33=5 pm/V in a predominantly c-axis-oriented film. These values confirm that the polarization vector of this material is close to the crystallographic a axis.

Published in:

Applied Physics Letters  (Volume:89 ,  Issue: 6 )

Date of Publication:

Aug 2006

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