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Low electrode induced optical losses in organic active single layer polyfluorene waveguides with two indium tin oxide electrodes deposited by pulsed laser deposition

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5 Author(s)
Lattante, S. ; Dipartimento di Fisica and National Nanotechnology Laboratory (NNL) of CNR-INFM, Universitý degli Studi di Lecce, Via per Arnesano, 73100 Lecce, Italy ; Romano, F. ; Caricato, A.P. ; Martino, M.
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Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.2222253 

We demonstrate that 20 nm thick indium tin oxide (ITO) layers deposited by pulsed laser deposition present sheet resistance as low as 130 Ω/◻ and very uniform morphology, with an average roughness of about 0.4 nm, and peak-to-valley roughness as low as 8.2 nm. This good uniformity allowed us to realize a single layer polyfluorene active waveguide with both top and bottom ITO electrodes showing clear amplified spontaneous emission and electrode induced losses as low as 3.0 cm-1. We investigated the effects of hole injection in the ASE intensity concluding that complete gain suppression due to polaron absorption would take place for current density of about 360 mA cm-2.

Published in:

Applied Physics Letters  (Volume:89 ,  Issue: 3 )

Date of Publication:

Jul 2006

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