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Structural properties of SrO thin films grown by molecular beam epitaxy on LaAlO3 substrates

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5 Author(s)
Maksimov, O. ; Electro-Optics Center, Pennsylvania State University, Freeport, Pennsylvania 16229 ; Heydemann, V.D. ; Fisher, P. ; Skowronski, M.
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SrO films were grown on LaAlO3 substrates by molecular beam epitaxy and characterized using reflection high-energy electron diffraction (RHEED) and x-ray diffraction (XRD). The evolution of the RHEED pattern is discussed as a function of film thickness. 500 Å thick SrO films were relaxed and exhibited RHEED patterns indicative of an atomically smooth surface having uniform terrace heights. Films had the epitaxial relationship (001)SrO||(001)LaAlO3; [010]SrO||[110]LaAlO3. This 45° in-plane rotation minimizes mismatch and leads to films of high crystalline quality, as verified by Kikuchi lines in the RHEED patterns and narrow rocking curves of the (002) XRD peak.

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Applied Physics Letters  (Volume:89 ,  Issue: 26 )