Cart (Loading....) | Create Account
Close category search window
 

Strain distribution in epitaxial SrTiO3 thin films

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

7 Author(s)
Zhai, Z.Y. ; National Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093, China and Department of Physics, Nanjing University, Nanjing 210093, China ; Wu, X.S. ; Jiang, Z.S. ; Hao, J.H.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.2424282 

The lattice strain distributions of epitaxial SrTiO3 films deposited on LaAlO3 were investigated by in situ x-ray diffraction at the temperature range of 25–300 K, grazing incident x-ray diffraction, and high resolution x-ray diffraction. The nearly linear temperature dependence of the out-of-plane lattice constant of SrTiO3 was observed in the measured temperature range. The depth distribution of the lattice strain at room temperature for SrTiO3 films includes the surface layer, strained layer, and interface layer.

Published in:

Applied Physics Letters  (Volume:89 ,  Issue: 26 )

Date of Publication:

Dec 2006

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.