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Atomic scale patterns formed during surface scanning by atomic force microscopy tips

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4 Author(s)
Teschke, Omar ; Laboratório de NanoEstruturas e Interfaces, Instituto de Física, UNICAMP, 13083-970 Campinas, San Paulo, Brazil ; Soares, David Mendez ; Valente Filho, Juracyr Ferraz ; de Souza, Elizabeth Fatima

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.2423245 

In this work, tip sliding at the water/substrate interfacial region was used to investigate the pattern observed during image acquisition with atomic resolution in atomic force microscopy. The process responsible for the pattern formation is the oscillatory movement of the tip in the direction that is normal to scanning induced by a change in the water interfacial dielectric permittivity from ε≈4 at the interface to ε≈80 (bulk value) that results in a variation of the measured force acting on the tip of ≈30 pN.

Published in:

Applied Physics Letters  (Volume:89 ,  Issue: 25 )

Date of Publication:

Dec 2006

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