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Effect of conductive LaNiO3 electrode on the structural and ferroelectric properties of Bi3.25La0.75Ti3O12 films

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3 Author(s)
Jain, M. ; Superconductivity Technology Center, Materials Physics and Applications Division, Los Alamos National Laboratory, Los Alamos, New Mexico 87545 ; Kang, B.S. ; Jia, Q.X.

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Ferroelectric Bi3.25La0.75Ti3O12 (BLT) films were grown on Pt/Ti/SiO2/Si (Pt/Si), LaNiO3/Pt/Si, and LaNiO3/Si substrates using chemical solution deposition technique. X-ray diffraction analysis shows that films grown on conductive LaNiO3 electrodes had higher degree of (117) orientation as compared to that grown directly on Pt/Si substrate. High remanent polarization value (2Pr)∼43.14 μC/cm2 (Ec of 111 kV/cm) under an applied field of 396 kV/cm was obtained for BLT film on LaNiO3/Pt/Si as compared to a value of 26 μC/cm2 obtained for BLT film on Pt/Si directly. There was no degradation in the switchable polarization (Psw-Pns) after 1010 switching cycles.

Published in:

Applied Physics Letters  (Volume:89 ,  Issue: 24 )