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Browse Journals & Magazines > Applied Physics Letters ...> Volume:89 Issue:23 Help

Microstructure and enhanced in-plane ferroelectricity of Ba0.7Sr0.3TiO3 thin films grown on MgAl2O4 (001) single-crystal substrate

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8 Author(s)
Zhou, X.Y. ; Department of Applied Physics, The Hong Kong Polytechnic University, Hong Kong, China and Materials Research Centre, The Hong Kong Polytechnic University, Hong Kong, China ; Heindl, T. ; Pang, H. ; Miao, J.
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The microstructure and in-plane dielectric and ferroelectric properties of highly oriented Ba0.7Sr0.3TiO3 (BST) thin film grown on MgAl2O4 (001) single-crystal substrate through pulsed laser deposition were investigated. X-ray diffraction measurements indicated that BST had a distorted lattice with a tetragonality a/c=1.012. The cross-sectional observation under transmission electron microscope revealed that, while most of BST grains grew epitaxially on MgAl2O4, the film also contained a noticeable amount of misoriented grains and dislocations. The electrical measurements indicated that the film had a shifted Curie temperature (TC=78 °C) and an enhanced in-plane ferroelectricity (remnant polarization Pr=7.1 μC/cm2) when compared with BST ceramic (TC≈33 °C and Pr≈0).

Published in:
Applied Physics Letters  (Volume:89 ,  Issue: 23 )

Date of Publication: Dec 2006

Page(s):
232906 - 232906-3
ISSN :
0003-6951
Digital Object Identifier :
10.1063/1.2402900
Date of Current Version :
18 June 2009
Issue Date :
Dec 2006

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