Close category search window
 

Silicon single electron transistors aiming at a high gate modulation factor

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Chen, Jiezhi ; Department of Physics, Nanjing University, Nanjing 210093, China and Key Laboratory of Advanced Photonic and Electronic Materials, Nanjing University, Nanjing 210093, China ; Shi, Yi ; Lin Pu ; Zheng, Youdou
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.2370874 

The authors report on the fabrication of a Si-based single electron transistor (SET), in which the gate is formed just on the top of quantum dots (QDs). By this kind of structure, the gate modulation factor can be modulated to be high, which provides a promising approach to improve the voltage gain. It is demonstrated that the gate modulation factor achieves 0.84 in the fabricated SET device with sub-10-nm QD at room temperature. The transport characteristics with Coulomb blockade oscillations and negative differential conductance are discussed.

Published in:
Applied Physics Letters  (Volume:89 ,  Issue: 17 )

Date of Publication: Oct 2006

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.