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Ultracompact silicon-on-insulator ridge-waveguide mirrors with high reflectance

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8 Author(s)
Velha, P. ; Laboratoire Charles Fabry de l’Institut d’Optique, Centre National de la Recherche Scientifique, Université Paris-Sud, Campus Polytechnique, RD 128, 91127 Palaiseau Cedex, France ; Rodier, J.C. ; Lalanne, P. ; Hugonin, J.P.
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Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.2372581 

Microcavities offering small modal volumes V≈0.6 (λ/n)3 and consisting of two identical tapered Bragg mirrors etched into a monomode silicon-on-insulator ridge waveguide are studied for operation at telecommunications wavelengths. The authors have measured a Q factor of 8900, for a loaded cavity with a peak transmission at resonance in excess of 60%. The measured Q value quantitatively agrees with the calculation results and is 20 times larger than those previously reported for similar geometries without tapers.

Published in:

Applied Physics Letters  (Volume:89 ,  Issue: 17 )

Date of Publication:

Oct 2006

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