By Topic

Retention loss phenomena in hydrothermally fabricated heteroepitaxial PbTiO3 films studied by scanning probe microscopy

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Ahn, W.S. ; Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, 373-1 Guseong-Dong, Yuseong-Gu, Daejeon 305-701, Republic of Korea ; Jung, W.W. ; Choi, S.K. ; Cho, Yasuo

Your organization might have access to this article on the publisher's site. To check, click on this link: 

We observed the retention loss phenomena of the nanodomains with an average diameter of 36 nm and that of the square domains with a size of 1 and 25 μm2 that were reversed by an applying electric field at an atomic force microscopy conductive tip in a heteroepitaxial PbTiO3 thin film, which was fabricated via hydrothermal epitaxy below Curie temperature, TC. While the nanodomains did not undergo significant retention loss until 5.3×106 s, the square domains revealed some retention loss for a fixed period after long latent periods. The observed phenomena were explained in terms of the instability of the curved c/c domain wall and the compressive strain energy. Analyses showed that the nanodomains composed a cylinder extending to the bottom electrode; however, the square domains had a curved c/c domain wall, including the compressive strain energy, and these factors caused the retention loss.

Published in:

Applied Physics Letters  (Volume:88 ,  Issue: 8 )