Cart (Loading....) | Create Account
Close category search window

Sub-200-fs pulsed erbium-doped fiber laser using a carbon nanotube-polyvinylalcohol mode locker

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Rozhin, Aleksey G. ; National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Higashi, Tsukuba, Ibaraki 305-8565, Japan ; Sakakibara, Y. ; Namiki, S. ; Tokumoto, Madoka
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link: 

We study the difference in mode-locked operations of different saturable absorber films made of single wall carbon nanotube-polyvinylalcohol nanocomposite. The films have different nanotube concentrations and thicknesses. For the study, a mode-locked erbium-doped fiber laser in a ring cavity configuration was constructed by setting the films in a microgap between a pair of fiber end facets. With the optimum film among those we have tested, the shortest pulses with a width of 178 fs were achieved at 1.56 μm with a repetition rate of 22.8 MHz and an average power of 1.55 mW.

Published in:

Applied Physics Letters  (Volume:88 ,  Issue: 5 )

Date of Publication:

Jan 2006

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.