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Carrier-to-noise ratio enhancement of super-resolution near-field structure disks by Ag nanostructure

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5 Author(s)
Arai, T. ; Center for Applied Near-field Optics Research (CAN-FOR), National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Higashi, Tsukuba 305-8562, Japan ; Kurihara, K. ; Nakano, T. ; Tominaga, J.
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The recording and retrieval characteristics of super-resolution near-field structure disks have been evaluated before and after the fabrication of a Ag-nanostructured film on the top dielectric layer, using a 405 nm wavelength laser and a 0.65 numerical aperture lens system. The carrier-to-noise ratio for 100 nm mark signals is significantly improved by applying the Ag-nanostructured film. The underlying mechanism for the enhancement depends on the top dielectric layer thickness. A simulation based on Mie theory shows good agreement with the measured reflectance spectrum for the Ag-nanostructured film.

Published in:

Applied Physics Letters  (Volume:88 ,  Issue: 5 )

Date of Publication:

Jan 2006

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