Cart (Loading....) | Create Account
Close category search window
 

Room-temperature chemical vapor deposition and mass detection on a heated atomic force microscope cantilever

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Sunden, Erik O. ; Woodruff School of Mechanical Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332-0405 ; Wright, T.L. ; Jungchul Lee ; King, W.P.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.2164916 

This letter reports the localized room-temperature chemical vapor deposition of carbon nanotubes (CNTs) onto an atomic force microscope cantilever having an integrated heater, using the cantilever self-heating to provide temperatures required for CNT growth. Precise temperature calibration of the cantilever was possible and the CNTs were synthesized at a cantilever heater temperature of 800 °C in reactive gases at room temperature. Scanning electron microscopy confirmed the CNTs were vertically aligned and highly localized to only the heater area of the cantilever. The cantilever mechanical resonance decreased from 119.10 kHz to 118.23 kHz upon CNT growth, and then returned to 119.09 kHz following cantilever cleaning, indicating a CNT mass of 1.4×10-14 kg. This technique for highly local growth and measurement of deposited CNTs creates new opportunities for interfacing nanomaterials with microstructures.

Published in:

Applied Physics Letters  (Volume:88 ,  Issue: 3 )

Date of Publication:

Jan 2006

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.