Cart (Loading....) | Create Account
Close category search window
 

Degradation of an X-Ku band GaAs/AlGaAs power HBT MMIC under RF stress

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Gupta, A. ; Adv. Technol. Div., Westinghouse Electr. Corp., Baltimore, MD, USA ; Ali, F. ; Dawson, Dale ; Smith, P.

This paper summarizes the observed degradation in the performance of a high-efficiency X-Ku band 1-W HBT power MMIC operating under ~2 dB compression for an extended period. The main finding of this study is that no new degradation mechanisms appeared, even under severe RF stress; the device degraded in the same manner as with DC stress only. The only significant change in device characteristics was increased base leakage current that resulted in a monotonic reduction in current gain after an initial period of stability, Output power of the MMIC remained essentially unchanged even after current gain had dropped to 60% of its initial value, RF properties of the device, both small and large signal, showed little change even after severe deterioration of DC characteristics. The results of this study suggest that HBT reliability can be effectively evaluated for most applications by applying only DC stress to the device

Published in:

Microwave and Guided Wave Letters, IEEE  (Volume:6 ,  Issue: 1 )

Date of Publication:

Jan 1996

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.