The high frequency performance of type-II InP/GaAsSb double heterojunction bipolar transistors (DHBTs) with compositionally graded and uniform 25 nm base layers and 65 nm InP collectors is investigated. The graded base DHBT achieves a peak current gain of 20.5 compared to 14.9 for the uniform base DHBT at current densities near 15 mA/μm2. The peak fT of a graded base device with 0.38×8 μm2 emitter dimensions improves from 505 GHz at 25 °C to 535 GHz at -55 °C as determined by -20 dB/decade extrapolation. The base grading has reduced the total transit time by 25% compared to the uniform base type-II DHBT.
Published in:
Applied Physics Letters
(Volume:88
,
Issue:
22
)
Date of Publication:
May 2006
- Page(s):
-
222101
-
222101-3
- ISSN :
-
0003-6951
- Digital Object Identifier :
-
10.1063/1.2207843
- Product Type:
-
Journals & Magazines
- Date of Current Version :
-
18 June 2009
- Issue Date :
-
May 2006