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Magnetic depth profiles from resonant soft x-ray scattering: Application to Dy thin films

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5 Author(s)
Ott, H. ; Institut für Experimentalphysik, Freie Universität Berlin, 14195 Berlin, Germany ; Schuβler-Langeheine, C. ; Schierle, E. ; Kaindl, G.
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We employ the strong variation of the photon penetration depth across an electronic resonance in soft x-ray scattering for a depth resolved study of an antiferromagnetic (AFM) thin film. We directly observed the development of the helical AFM structure in thin Dy(001) films on W(110) across the temperature-induced phase transition from ferromagnetic to helical AFM order.

Published in:

Applied Physics Letters  (Volume:88 ,  Issue: 21 )

Date of Publication:

May 2006

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