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In situ x-ray diffraction study of the thermal expansion of the ordered arrays of silver nanowires embedded in anodic alumina membranes

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8 Author(s)
Xu, Xi Jin ; Key Laboratory of Materials Physics, Institute of Solid State Physics, Chinese Academy of Sciences, P.O. Box 1129, Hefei 230031, People’s Republic of China and Hefei Institutes of Physical Science, Chinese Academy of Sciences, P.O. Box 1129, Hefei 230031, People’s Republic of China ; Fei, Guang Tao ; Yu, Wen Hui ; Chen, Li
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Thermal expansion of as-prepared and annealed ordered arrays of silver nanowires embedded in anodic alumina membranes (AAMs) was studied by in situ x-ray diffraction measurement in the temperature range from 25 to 800 °C. The axial thermal expansion coefficient (TEC) for the as-prepared nanowires is 6.35×10-9C and 6.02×10-6C below and above 650 °C, respectively. However, the TEC of the annealed sample turns from 2.32×10-6C to 12.06×10-6C when the temperature is above 350 °C. The collective effects of the intrinsic expansion, surface pressure, the limit effect of AAM, and the vacancies incorporated into the silver lattice were responsible for the thermal expansion.

Published in:

Applied Physics Letters  (Volume:88 ,  Issue: 21 )