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Relaxor ferroelectricity in strained epitaxial SrTiO3 thin films on DyScO3 substrates

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8 Author(s)
Biegalski, M.D. ; Materials Research Institute, Pennsylvania State University, University Park, Pennsylvania 16802 ; Jia, Y. ; Schlom, D.G. ; Trolier-McKinstry, S.
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The ferroelectric properties of 500 Å thick strained, epitaxial SrTiO3 films grown on DyScO3 substrates by reactive molecular-beam epitaxy are reported. Despite the near 1% biaxial tensile strain, the x-ray rocking curve full widths at half maximum in ω are as narrow as 7 arc sec (0.002°). The films show a frequency-dependent permittivity maximum near 250 K that is well fit by the Vogel-Fulcher equation. A clear polarization hysteresis is observed below the permittivity maximum, with an in-plane remanent polarization of 10 μC/cm2 at 77 K. The high Tmax is consistent with the biaxial tensile strain state, while the superimposed relaxor behavior is likely due to defects.

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Applied Physics Letters  (Volume:88 ,  Issue: 19 )