By Topic

Relaxor ferroelectricity in strained epitaxial SrTiO3 thin films on DyScO3 substrates

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

8 Author(s)
Biegalski, M.D. ; Materials Research Institute, Pennsylvania State University, University Park, Pennsylvania 16802 ; Jia, Y. ; Schlom, D.G. ; Trolier-McKinstry, S.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link: 

The ferroelectric properties of 500 Å thick strained, epitaxial SrTiO3 films grown on DyScO3 substrates by reactive molecular-beam epitaxy are reported. Despite the near 1% biaxial tensile strain, the x-ray rocking curve full widths at half maximum in ω are as narrow as 7 arc sec (0.002°). The films show a frequency-dependent permittivity maximum near 250 K that is well fit by the Vogel-Fulcher equation. A clear polarization hysteresis is observed below the permittivity maximum, with an in-plane remanent polarization of 10 μC/cm2 at 77 K. The high Tmax is consistent with the biaxial tensile strain state, while the superimposed relaxor behavior is likely due to defects.

Published in:

Applied Physics Letters  (Volume:88 ,  Issue: 19 )