Charge transport of copper phthalocyanine single-crystal field-effect transistors stable above 100 °C

Intrinsic charge transport of copper phthalocyanine single-crystal field-effect transistors is measured as function of temperature up to above 100 °C. The conduction of the accumulated carriers shows hopping-type transport, so that the field-effect mobility increases with temperature following activation-type temperature dependence throughout the measured temperature region. Due to excellent material stability at the high temperature, the mobility values are precisely reproduced after the heat cycles.