By Topic

Charge transport of copper phthalocyanine single-crystal field-effect transistors stable above 100 °C

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Yamada, Koichi ; MSRL, CRIEPI, Tokyo 201-8511, Japan ; Takeya, J. ; Shigeto, K. ; Tsukagoshi, K.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.2187412 

Intrinsic charge transport of copper phthalocyanine single-crystal field-effect transistors is measured as function of temperature up to above 100 °C. The conduction of the accumulated carriers shows hopping-type transport, so that the field-effect mobility increases with temperature following activation-type temperature dependence throughout the measured temperature region. Due to excellent material stability at the high temperature, the mobility values are precisely reproduced after the heat cycles.

Published in:

Applied Physics Letters  (Volume:88 ,  Issue: 12 )