Cart (Loading....) | Create Account
Close category search window

Thermoelectric properties and microstructure of c-axis-oriented Ca3Co4O9 thin films on glass substrates

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Hu, Y.F. ; Materials Science Department, Brookhaven National Laboratory, Upton, New York 11973 ; Sutter, E. ; Si, W.D. ; Li, Qiang

Your organization might have access to this article on the publisher's site. To check, click on this link: 

c-axis-oriented Ca3Co4O9 thin films have been grown directly on glass (fused silica) substrate by pulsed laser deposition. Detailed microstructure analysis showed stacking faults abundant throughout the films. However, the Seebeck coefficient (∼130 μV/K) and resistivity (∼4.3 mΩ cm) of these films on glass substrate at room temperature were found comparable to those of the single-crystal samples. The presence of these structural defects could reduce thermal conductivity, and thus enhance the overall performance of cobaltate films to be potentially used in the thermoelectric devices.

Published in:

Applied Physics Letters  (Volume:87 ,  Issue: 17 )

Date of Publication:

Oct 2005

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.