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Enhanced flux pinning in YBa2Cu3O7-δ films by nanoscaled substrate surface roughness

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6 Author(s)
Ye, Zu-Xin ; Materials Science Department, Brookhaven National Laboratory, Upton, New York 11973 ; Li, Qiang ; Hu, Y. ; Si, W.D.
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Nanoscaled substrate surface roughness is shown to strongly influence the critical current density (Jc) in YBa2Cu3O7-δ (YBCO) films made by pulsed-laser deposition on the crystalline LaAlO3 substrates consisting of two separate twin-free and twin-rich regions. The nanoscaled corrugated substrate surface was created in the twin-rich region during the deposition process. Using magneto-optical imaging techniques coupled with optical and atomic force microscopy, we observed an enhanced flux pinning in the YBCO films in the twin-rich region, resulting in a ∼30% increase in Jc, which was unambiguously confirmed by the direct transport measurement.

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Applied Physics Letters  (Volume:87 ,  Issue: 12 )