By Topic

Imaging of Recording Marks and Their Jitters With Different Writing Strategy and Terminal Resistance of Optical Output

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Cheng Hung Chu ; Dept. of Phys., Nat. Taiwan Univ., Taipei ; Bau Jung Wu ; Tsung Sheng Kao ; Yuan Hsing Fu
more authors

The relation between recording mark formation and jitter value with radial orient spot (ROS) type laser spot recording was investigated by using a new imaging method of conductive-atomic force microscopy (C-AFM). The readout performances of recording marks were studied by changing the terminal resistance of optical pickup head and writing strategies. The results of clear C-AFM images showed that is possible to adjust the conditions of terminal resistance and writing strategies to have better readout signal performance.

Published in:

IEEE Transactions on Magnetics  (Volume:45 ,  Issue: 5 )