Scheduled System Maintenance:
On Monday, April 27th, IEEE Xplore will undergo scheduled maintenance from 1:00 PM - 3:00 PM ET (17:00 - 19:00 UTC). No interruption in service is anticipated.
By Topic

A Flexible Framework for Quality Assurance of Software Artefacts with Applications to Java, UML, and TTCN-3 Test Specifications

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Nodler, J. ; Inst. for Comput. Sci., Univ. of Gottingen, Gottingen ; Neukirchen, H. ; Grabowski, J.

Manual reviews and inspections of software artefacts are time consuming and thus, automated analysis tools have been developed to support the quality assurance of software artefacts. Usually, software analysis tools are implemented for analysing only one specific language as target and for performing only one class of analyses. Furthermore, most software analysis tools support only common programming languages, but not those domain-specific languages that are used in a test process. As a solution, a framework for software analysis is presented that is based on a flexible, yet high-level facade layer that mediates between analysis rules and the underlying target software artefact; the analysis rules are specified using high-level XQuery expressions. Hence, further rules can be quickly added and new types of software artefacts can be analysed without needing to adapt the existing analysis rules. The applicability of this approach is demonstrated by examples from using this framework to calculate metrics and detect bad smells in Java source code, in UML models, and in test specifications written using the testing and test control notations (TTCN-3).

Published in:

Software Testing Verification and Validation, 2009. ICST '09. International Conference on

Date of Conference:

1-4 April 2009