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Post-Process Removal of Spurious Fabry-PÉrot Oscillations Caused by Cleaved Waveguide-Ends

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3 Author(s)
Gnan, M. ; Dept. of Eng., Univ. of Ferrara, Ferrara ; Bellanca, G. ; De La Rue, R.M.

Testing of integrated (guided-wave) optical component that uses cleaved facets for input/output coupling has to deal with spurious Fabry-Perot cavity effects that can interfere heavily with observation and measurement of the behavior of the device. This paper demonstrates a technique that takes advantage of such interference for the reconstruction of the complete characteristics of a generic component. By studying a theoretical model of the system, a post-process computational tool is developed and verified through numerical testing. Starting from a single transmittance data set, the amplitude and phase of the transmission and reflection coefficients are reconstructed with considerable accuracy. Initial experimental testing demonstrates consistency in reconstructing the behavior of a real device.

Published in:

Lightwave Technology, Journal of  (Volume:27 ,  Issue: 5 )