Cart (Loading....) | Create Account
Close category search window
 

Low energy single event upset/single event transient-tolerant latch for deep subMicron technologies

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Fazeli, M. ; Dept. of Comput. Eng., Sharif Univ. of Technol., Tehran ; Miremadi, S.G. ; Ejlali, A. ; Patooghy, A.

Single event upsets (SEUs) and single event transients (SETs) are major reliability concerns in deep submicron technologies. As technology feature size shrinks, digital circuits are becoming more susceptible to SEUs and SETs. A novel SEU/SET-tolerant latch called feedback redundant SEU/SET-tolerant latch (FERST) is presented, where redundant feedback lines are used to mask SEUs and delay elements are used to filter SETs. Detailed SPICE simulations have been done to evaluate the proposed design and compare it with previous latch designs. The results show that the SEU tolerance of the FERST latch is almost equal to that of a TMR latch (a widely used latch which is the most reliable among the previous latches); however, the FERST latch consumes about 50% less energy and occupies 42% less area than the triple modular redundancy (TMR) latch. Furthermore, the results show that more than 90% of the injected SETs can be masked by the FERST latch if the delay size is properly selected.

Published in:

Computers & Digital Techniques, IET  (Volume:3 ,  Issue: 3 )

Date of Publication:

May 2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.