Notification:
We are currently experiencing intermittent issues impacting performance. We apologize for the inconvenience.
By Topic

Analyzing structure-based techniques for test coverage on a J2ME software product line

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Silva, L. ; Dept. of Comput. & Syst., Univ. of Pernambuco, Recife ; Soares, S.

To constantly test software, in order to keep it as free as possible from defects, it is required to find and apply a testing approach that best fits the product under test. The variety of problems and the richness of existing approaches make the challenge to choose and plan for a better combination to reach desired quality level even harder. This paper introduces a case study that aims presenting different test coverage values according to the used approach. The context of our study considers the application of structure-based techniques on a Java ME software product line, which makes testing even more critical due to software complexity. In this work we present code coverage analysis and evaluation of main differences between data flow and control flow techniques, considering the use of a test tool and the reuse of test assets in different software versions from a software product line.

Published in:

Test Workshop, 2009. LATW '09. 10th Latin American

Date of Conference:

2-5 March 2009