Close category search window
 

Non-rigid registration using free-form deformations for recognition of facial actions and their temporal dynamics

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Koelstra, S. ; Queen Mary, Univ. of London, London ; Pantic, M.

In this paper we propose an appearance-based approach to recognition of facial action units (AUs) and their temporal segments in frontal-view face videos. Non-rigid registration using free-form deformations is used to determine motion in the face region of an input video. The extracted motion fields are then used to derive motion histogram descriptors. Per AU, a combination of ensemble learners and hidden Markov models detects the presence of the AU in question and its temporal segment in each frame of an input sequence. When tested for recognition of all 27 lower and upper face AUs, occurring alone or in combination in 264 sequences from the MMI facial expression database, an average sequence classification rate of 94.3% was achieved.

Published in:
Automatic Face & Gesture Recognition, 2008. FG '08. 8th IEEE International Conference on

Date of Conference: 17-19 Sept. 2008

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.