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3D Active Edge Silicon Detector Tests With 120 GeV Muons

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26 Author(s)
Da Via, C. ; Phys. & Astron. Dept., Univ. of Manchester, Manchester ; Deile, M. ; Hasi, J. ; Kenney, C.
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3D detectors with electrodes penetrating through the silicon wafer and covering the edges were tested in the SPS beam line X5 at CERN in autumn 2003. Detector parameters including efficiency, signal-to-noise ratio, and edge sensitivity were measured using a silicon telescope as a reference system. The measured sensitive width and the known silicon width were equal within less than 10 mum.

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Nuclear Science, IEEE Transactions on  (Volume:56 ,  Issue: 2 )