By Topic

Accurate de-embedding technique for on-chip small-signal characterization of high-frequency optical modulator

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

9 Author(s)
Loi, K.K. ; Dept. of Electr. & Comput. Eng., California Univ., San Diego, La Jolla, CA, USA ; Sakamoto, I. ; Shao, X.F. ; Hou, H.Q.
more authors

A simple and accurate de-embedding technique has been developed for characterizing the microwave circuit behavior of noninsertable multiple quantum well waveguide modulators with on-chip two-port S-parameter measurements. The small signal equivalent circuit parameters extracted from the error corrected modulation response show an excellent agreement with both one-port microwave reflection coefficient measurement and CV data measured at 1 MHz.

Published in:

Photonics Technology Letters, IEEE  (Volume:8 ,  Issue: 3 )