By Topic

Gain, refractive index, and /spl alpha/-parameter in InGaAs-GaAs SQW broad-area lasers

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
D. J. Bossert ; US Air Force Phillips Lab., Kirtland AFB, NM, USA ; D. Gallant

Gain, refractive index, and the linewidth enhancement factor, or /spl alpha/-parameter, are measured in broad-area InGaAs-GaAs single-quantum-well semiconductor lasers using below-threshold amplified spontaneous emission spectra and a far-field filtering technique. The /spl alpha/ parameter is shown to increase dramatically with increasing carrier density and wavelength. Modes propagating in the transparent substrate of the lasers are shown to have a significant influence on the measured value of /spl alpha/.

Published in:

IEEE Photonics Technology Letters  (Volume:8 ,  Issue: 3 )